User Tools

Site Tools


s800_spectcl

Differences

This shows you the differences between two versions of the page.

Link to this comparison view

Both sides previous revision Previous revision
Next revision
Previous revision
Next revision Both sides next revision
s800_spectcl [2013/12/12 13:04]
pereira [Frequently used parameters for the S800]
s800_spectcl [2015/10/29 13:28]
pereira [S800 SpecTcl]
Line 3: Line 3:
  
  
-The SpecTcl Control has been adapted for special functions required for the analysis of S800 data. Fig xxx shows the GUI control of the S800 analysis.+The SpecTcl Control has been adapted for special functions required for the analysis of S800 data. SpecTcl can be open by from computer [[Software#u6pc5 (data U6)|u6pc5]] by clicking in the icon **SpecTcl** located in its desktop, or from a Linux terminal by typing ''./SpecTcl'' from directory **/user/s800/operations/spectcl/s800v7** 
  
-{{:wiki:SpecTclcontrol.jpg}}+Spectra definition files can be found in directory **/user/s800/operations/spectcl/s800v7/Definitions**. Some pre-defined windows with useful spectra can be found in directory **/user/s800/operations/spectcl/s800v7Windows**.
  
 +The figure below shows the GUI control of the S800 analysis. 
  
 +{{:wiki:SpecTclcontrol.jpg}}
  
-The inverse map which enables the trajectory reconstruction of the particles within the spectrograph beam line can be loaded. Snapshots of CRDC and TPPAC events sampled in the pads and strips can be viewed. If this option is "armed", the sample is read out for the first event that falls into the specified gate. This is a diagnostics tool to analyze the response of the CRDCs and TPPACs. +The inverse map which enables the trajectory reconstruction of the particles within the spectrograph beam line can be loaded. Snapshots of [[Detectors#Cathode Readout Drift Chambers (CRDC)|CRDC]] and [[Detectors#Tracking Parallel Plate Avalanche Counters (TPPAC)|TPPAC]] events sampled in the pads and strips can be viewed. If this option is "armed", the sample is read out for the first event that falls into the specified gate. This is a diagnostics tool to analyze the response of the CRDCs and TPPACs. 
    
  
Line 24: Line 26:
   * **s800.fp.crdc1 s800.fp.crdc2**   * **s800.fp.crdc1 s800.fp.crdc2**
     * **.x** and **.y**: x and y positions of the particles hitting the CRDCs (calibrated)      * **.x** and **.y**: x and y positions of the particles hitting the CRDCs (calibrated) 
-    * **.tac**: the raw drift time of the electrons in the CRDCs which finally relates to the y position via the mask calibration +    * **.tac**: the raw drift time of the electrons in the CRDCs which can be related to the y position via the mask calibration 
     * **.calc.x_gravity**, **.calc.x_fit**: the x position in the CRDCs calculated using two methods (center-of-gravity or Gaussian fit) to determine the CRDC x position from the charge distribution induced in the pads by the electrons drifting towards the anode wire.     * **.calc.x_gravity**, **.calc.x_fit**: the x position in the CRDCs calculated using two methods (center-of-gravity or Gaussian fit) to determine the CRDC x position from the charge distribution induced in the pads by the electrons drifting towards the anode wire.
-    *  .anode: amplitude of the CRDC anode signal (used for diagnostics) +    *  **.anode**: amplitude of the CRDC anode signal (used for diagnostics) 
   * **s800.fp.track**   * **s800.fp.track**
     * **.afp**: dispersive angle in the focal plane calculated from the x-y positions of the particles measured with the CRDCs      * **.afp**: dispersive angle in the focal plane calculated from the x-y positions of the particles measured with the CRDCs 
Line 61: Line 63:
     * **.xfpCorrection**, **.xfpe1Correction**, **.xfpe2Correction**: corrections applied to the TOF measured between the extended focal plane scintillator (A1900) and the trigger scintillator. Details of the corrections will change from experiment to experiment and are accessible via the CS800.cpp file of the S800 SpecTcl source code     * **.xfpCorrection**, **.xfpe1Correction**, **.xfpe2Correction**: corrections applied to the TOF measured between the extended focal plane scintillator (A1900) and the trigger scintillator. Details of the corrections will change from experiment to experiment and are accessible via the CS800.cpp file of the S800 SpecTcl source code
    
 +
 +===== Sample spectra =====
 +The following figures depict some of the S800 SpecTcl spectra used for the tunning of the S800.
 +
 +
 +==== Energy loss in the ion chamber vs. time of flight measured between the object scintillator and the E1 scintillator (trigger) at the end of the focal plane ====
 +
 +{{:wiki:s800_pid.jpg?600}}
 +
 +// 
 +// 
 +// 
 +// 
 +// 
 +// 
 +
 +====(In)elastic scattering of the incoming "cocktail beam" on a Au target (spectrograph in focus mode) ====
 +
 +{{:wiki:s800_identification.jpg?600}}
 +
 +
  
  
 +==== Sn-124 primary beam passing a thick Al viewer at the target position (focused optics) ====
  
 +{{:wiki:working_crdc2_sn124.jpg}}
  
 +**Upper left**: Three <sup>124</sup>Sn charge states in the CRDC2 x-y spectrum 
  
 +**Upper right**: Amplitude of the CRDC2 anode signal vs. drift time (this is a diagnostics spectrum showing that the response of the CRDC is not correlated with the y position). 
  
 +**Lower left**: Raw drift time measured in CRDC2
  
 +**Lower right**: Charge distribution induced in the pads by the three <sup>124</sup>Sn charge states hitting CRDC2. 
  
  
s800_spectcl.txt ยท Last modified: 2023/09/20 16:00 by swartzj