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s800_spectcl [2013/12/17 13:16]
pereira [Sn-124 primary beam passing a thick Al viewer at the target position (focused optics)]
s800_spectcl [2014/12/03 18:39]
pereira [S800 SpecTcl]
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-The SpecTcl Control has been adapted for special functions required for the analysis of S800 data. Fig xxx shows the GUI control of the S800 analysis.+The SpecTcl Control has been adapted for special functions required for the analysis of S800 data. SpecTcl can be open by from computer [[Software#u6pc5 (data U6)|u6pc5]] by clicking in the corresponding icon located in its desktop. The figure below shows the GUI control of the S800 analysis. 
  
 {{:wiki:SpecTclcontrol.jpg}} {{:wiki:SpecTclcontrol.jpg}}
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-The inverse map which enables the trajectory reconstruction of the particles within the spectrograph beam line can be loaded. Snapshots of CRDC and TPPAC events sampled in the pads and strips can be viewed. If this option is "armed", the sample is read out for the first event that falls into the specified gate. This is a diagnostics tool to analyze the response of the CRDCs and TPPACs. +The inverse map which enables the trajectory reconstruction of the particles within the spectrograph beam line can be loaded. Snapshots of [[Detectors#Cathode Readout Drift Chambers (CRDC)|CRDC]] and [[Detectors#Tracking Parallel Plate Avalanche Counters (TPPAC)|TPPAC]] events sampled in the pads and strips can be viewed. If this option is "armed", the sample is read out for the first event that falls into the specified gate. This is a diagnostics tool to analyze the response of the CRDCs and TPPACs. 
    
  
s800_spectcl.txt ยท Last modified: 2023/09/20 16:00 by swartzj