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tuning_the_s800_xdt [2023/09/22 14:48]
swartzj [FP scintillator setup]
tuning_the_s800_xdt [2023/09/22 15:15]
swartzj [CRDCs setup]
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   * **[[hv bias#hv remote control|Bias]]** CRDCs   * **[[hv bias#hv remote control|Bias]]** CRDCs
       * Look at anode signal on **[[electronics overview|scope]]**  while biasing drift and anode       * Look at anode signal on **[[electronics overview|scope]]**  while biasing drift and anode
-          * Patched to data-U6 on labeled connector+          * Patched to data-U4 on labeled connector
           * **200 – 500 mV** signals are good           * **200 – 500 mV** signals are good
           * CRDC1 anode is noisier (digital noise) than CRDC2            * CRDC1 anode is noisier (digital noise) than CRDC2 
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       * Count rate is a little higher than on scintillator due to noise or thresholds       * Count rate is a little higher than on scintillator due to noise or thresholds
  
-  * Check **[[s800 SpecTcl|Spectcl]]** window **S800_CRDCS.win** (see figure below), or, alternatively **S800_MEGASUMMARY.win** to verify the good performance of the detectors. (The spectra for each CRDC can be checked separatelly in windows **s800_CRDC1.win** and **S800_CRDC2.win**)+  * Check **[[s800 SpecTcl|Spectcl]]** window **S800_CRDCS.win** (see figure below), or, alternatively **S800_MEGASUMMARY.win** to verify the good performance of the detectors. (The spectra for each CRDC can be checked separately in windows **s800_CRDC1.win** and **S800_CRDC2.win**)
  
       * Spectra **crdc1.raws** and **crdc2.raws**        * Spectra **crdc1.raws** and **crdc2.raws** 
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          * Make a summing region around the "bananas" in spectra **crdc1.x.tac!ic** and **crdc2.x.tac!ic** (bottom left and right plots respectively)          * Make a summing region around the "bananas" in spectra **crdc1.x.tac!ic** and **crdc2.x.tac!ic** (bottom left and right plots respectively)
          * Stop the run and rescan data from disk          * Stop the run and rescan data from disk
-         * Compare the number of event inside the 2D summing regions with the number of events inside the **ic** gate. Typically the former are very close to the later (nearly 100% efficiency for medium/high Z)+         * Compare the number of event inside the 2D summing regions with the number of events inside the **ic** gate. Typically the former are very close to the latter (nearly 100% efficiency for medium/high Z)
  
 {{:wiki:CRDCS-eff-015028.png?550|S800_CRDCS_EFF.win SpecTcl window}} {{:wiki:CRDCS-eff-015028.png?550|S800_CRDCS_EFF.win SpecTcl window}}
tuning_the_s800_xdt.txt · Last modified: 2023/09/22 15:15 by swartzj